12-20 July 2017
BEXCO
Asia/Seoul timezone
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Contribution

BEXCO - Room F(201/202/203/204)

[NU024] Reliability studies for KM3NeT electronics: The FIDES method

Speakers

  • Giulia ILLUMINATI

Primary authors

Co-authors

Description

High reliability of electronics is necessary for those systems operating in hard conditions, in particular when in-situ maintenance is not possible, as it is the case for space or deep-sea projects. The KM3NeT infrastructure, whose first Detection Units are currently being deployed on the Mediterranean Sea at depths of 2500-3500 meters, has chosen the FIDES methods as reliability technique to estimate the failure in time of the different electronics boards. In the present article, the application of the FIDES method to the electronics of the Digital Optical Modules of the KM3NeT neutrino telescope is described in detail.